[{"portal_cr_id":null,"source_key":"crdb:34.109|0046|-|Rel-7","specification":"34.109","cr_number":"0046","revision":null,"category":"B","impacted_version":"7.3.0","target_release":"Rel-7","title":"Introduction of UE test loop mode 4 for testing of network initiated secondary PDP context","wg_tdoc":"R2-111401","wg_status":"agreed","wg_meeting":"3GPPRAN2#73","tsg_tdoc":"RP-110263","tsg_status":"approved","tsg_meeting":"3GPPRAN#51","new_version":"7.4.0","source_url":"ftp://ftp.3gpp.org/Information/Databases/Change_Request/CRDB_20260715.zip","detail_synced_at":null,"work_items":["TEI7"],"work_item_associations":[{"uid":60110,"acronym":"TEI7","association_sources":["crdb"],"association_status":"source_tracked"}]},{"portal_cr_id":null,"source_key":"crdb:34.109|0043|-|Rel-7","specification":"34.109","cr_number":"0043","revision":null,"category":"F","impacted_version":"7.2.0","target_release":"Rel-7","title":"Enhancement of UE test loop mode 3 for MBMS MBSFN testing","wg_tdoc":"R5-083531","wg_status":"agreed","wg_meeting":"3GPPRAN5#40","tsg_tdoc":"RP-080568","tsg_status":"approved","tsg_meeting":"3GPPRAN#41","new_version":"7.3.0","source_url":"ftp://ftp.3gpp.org/Information/Databases/Change_Request/CRDB_20260715.zip","detail_synced_at":null,"work_items":["MBMSE-RANPhysTDD_UEConTest"],"work_item_associations":[{"uid":25049,"acronym":"MBMSE-RANPhysTDD_UEConTest","association_sources":["crdb"],"association_status":"source_tracked"}]},{"portal_cr_id":null,"source_key":"crdb:34.109|0042|2|Rel-7","specification":"34.109","cr_number":"0042","revision":"2","category":"A","impacted_version":"7.1.0","target_release":"Rel-7","title":"Correction of max RLC SDU size","wg_tdoc":"R2-071119","wg_status":"agreed","wg_meeting":null,"tsg_tdoc":"RP-070153","tsg_status":"approved","tsg_meeting":"3GPPRAN#35","new_version":"7.2.0","source_url":"ftp://ftp.3gpp.org/Information/Databases/Change_Request/CRDB_20260715.zip","detail_synced_at":null,"work_items":[],"work_item_associations":[]},{"portal_cr_id":null,"source_key":"crdb:34.109|0040|-|Rel-7","specification":"34.109","cr_number":"0040","revision":null,"category":"B","impacted_version":"7.0.0","target_release":"Rel-7","title":"Enhancements of UE test loop mode 1 for E-DCH RF performance testing","wg_tdoc":"R2-063637","wg_status":"agreed","wg_meeting":"3GPPRAN2#56","tsg_tdoc":"RP-060716","tsg_status":"approved","tsg_meeting":"3GPPRAN#34","new_version":"7.1.0","source_url":"ftp://ftp.3gpp.org/Information/Databases/Change_Request/CRDB_20260715.zip","detail_synced_at":null,"work_items":["EDCH-L23"],"work_item_associations":[{"uid":20006,"acronym":"EDCH-L23","association_sources":["crdb"],"association_status":"source_tracked"}]},{"portal_cr_id":null,"source_key":"crdb:34.109|0038|-|Rel-7","specification":"34.109","cr_number":"0038","revision":null,"category":"B","impacted_version":"6.1.0","target_release":"Rel-7","title":"Introduction of UE test loop mode 3 (SDU counters) to support MTCH performance testing.","wg_tdoc":"R2-062632","wg_status":"endorsed","wg_meeting":"3GPPRAN2#54","tsg_tdoc":"RP-060599","tsg_status":"withdrawn","tsg_meeting":"3GPPRAN#33","new_version":"..","source_url":"ftp://ftp.3gpp.org/Information/Databases/Change_Request/CRDB_20260715.zip","detail_synced_at":null,"work_items":["MBMS-RAN-RF_Test"],"work_item_associations":[{"uid":25014,"acronym":"MBMS-RAN-RF_Test","association_sources":["crdb"],"association_status":"source_tracked"}]}]